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US Patent Issued to SAMSUNG ELECTRONICS on April 21 for "Clamshell-type electronic device capable of detecting light source and illuminance" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,502, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Clamshell-type electronic device capable o... और पढ़ें


US Patent Issued to AMS INTERNATIONAL on April 21 for "Dynamic range extension of SPAD-based devices" (Dutch Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,503, issued on April 21, was assigned to AMS INTERNATIONAL AG (Jona, Switzerland). "Dynamic range extension of SPAD-based devices" was inv... और पढ़ें


US Patent Issued to SHENZHEN XPECTVISION TECHNOLOGY on April 21 for "Methods of operation of image sensor" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,504, issued on April 21, was assigned to SHENZHEN XPECTVISION TECHNOLOGY Co. LTD. (Guangdong, China). "Methods of operation of image senso... और पढ़ें


US Patent Issued to SEIKO EPSON on April 21 for "Color measurement apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,505, issued on April 21, was assigned to SEIKO EPSON Corp. (Tokyo). "Color measurement apparatus" was invented by Katsumi Yamada (Matsumot... और पढ़ें


US Patent Issued to Seiko Epson on April 21 for "Color measuring system, backing plate, and color measuring apparatus" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,506, issued on April 21, was assigned to Seiko Epson Corp. (Tokyo). "Color measuring system, backing plate, and color measuring apparatus"... और पढ़ें


US Patent Issued to Purdue Research Foundation on April 21 for "Autonomous phenotype imaging system" (Indiana Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,507, issued on April 21, was assigned to Purdue Research Foundation (West Lafayette, Ind.). "Autonomous phenotype imaging system" was inve... और पढ़ें


US Patent Issued to MURATA MANUFACTURING on April 21 for "Piezoelectric interferometer" (Finnish Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,508, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Piezoelectric interferometer" was invented by... और पढ़ें


US Patent Issued to MURATA MANUFACTURING on April 21 for "Interferometer with absorbing layer" (Finnish Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,509, issued on April 21, was assigned to MURATA MANUFACTURING Co. LTD. (Nagaokakyo, Japan). "Interferometer with absorbing layer" was inve... और पढ़ें


US Patent Issued to ANRITSU on April 21 for "Optical spectrum analyzer" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,510, issued on April 21, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Optical spectrum analyzer" was invented by Maki Ueno (Kanagawa,... और पढ़ें


US Patent Issued to TSINGHUA UNIVERSITY, BEIJING SEETRUM TECHNOLOGY on April 21 for "Reconstruction method and device for spectral image" (Chinese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,511, issued on April 21, was assigned to TSINGHUA UNIVERSITY (Beijing) and BEIJING SEETRUM TECHNOLOGY Co. LTD. (Beijing). "Reconstruction ... और पढ़ें